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SM EN IEC 60749-30:2021
Semiconductor devices. Mechanical and climatic test methods. Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
- Statute : Replaces
- Effective date : 03.03.2021
- Is valid? : Yes
- Available in : English
- Pages : 22
Classification of the standard
- ICS code
- Name
- 31.080.01
- Semiconductor devices in general
Link between documents
- Link type
- Notation
- Replacing
- SM EN 60749-30:2014
- Replacing
- SM EN 60749-30:2014/A1:2014
- IDT-identical international
- IEC 60749-30:2020
- IDT
- EN IEC 60749-30:2020