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SM EN 60749-30:2014/A1:2014
Semiconductor devices. Mechanical and climatic test methods. Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
- Statute : Withdrawn
- Effective date : 13.08.2014
- Is valid? : No
- Terms of validity : 21.09.2023
- Available in : English
- Pages : 18
Classification of the standard
- ICS code
- Name
- 31.080.01
- Semiconductor devices in general
Link between documents
- Link type
- Notation
- Replaced by
- SM EN IEC 60749-30:2021
- IDT
- EN 60749-30:2005/A1:2011
- Ammends
- SM EN 60749-30:2014