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  3. IEC 60749-26:2013
IEC 60749-26:2013 Semiconductor devices. Mechanical and climatic test methods. Part 26: Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
  • Statute : Replaced
  • Is valid? : No
  • Available in : English
  • Pages :
Classification of the standard
  • ICS code
  • Name
  • 31.080.01
  • Semiconductor devices in general
Link between documents
  • Link type
  • Notation
  • Replaced by
  • IEC 60749-26:2018
  • Replaced by
  • IEC 60749-26:2018
  • Replacing
  • IEC 60749-26:2006

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